KLA YieldStar: Advanced Metrology and Process Control for Semiconductor Manufacturing

KLA YieldStar is a cutting-edge optical metrology and process control solution designed to enhance yield, process control, and efficiency in semiconductor manufacturing. YieldStar is widely used in lithography and process optimization, offering unparalleled precision in measuring critical dimensions (CD), overlay, and focus during wafer production. This high-precision measurement technology is essential for ensuring process uniformity and product quality in advanced semiconductor manufacturing.

YieldStar uses advanced scatterometry and optical metrology techniques to provide fast, accurate, and non-destructive measurements of wafers during production. It enables manufacturers to detect and correct variations in real-time, optimizing lithography processes and improving overall yield. The system can measure extremely small features, making it ideal for sub-7nm process nodes used in leading-edge semiconductor devices.

The platform integrates seamlessly with manufacturing execution systems (MES) and process control systems, allowing real-time feedback for process adjustments. YieldStar’s automation capabilities help reduce operator intervention, streamline workflows, and accelerate production cycles, ensuring faster time to market for semiconductor products.

By providing highly accurate in-line metrology data, KLA YieldStar helps manufacturers optimize their lithography, etch, and deposition processes, resulting in improved wafer quality and production efficiency. Its ability to deliver actionable data for both process development and high-volume manufacturing makes it an essential tool for leading semiconductor fabs.

• Key Benefits:

  • Advanced optical metrology solution for semiconductor manufacturing.

  • Precise measurement of critical dimensions (CD), overlay, and focus in real-time.

  • Ideal for sub-7nm process nodes, enabling process optimization at leading-edge semiconductor fabs.

  • Scatterometry and optical metrology for non-destructive, high-accuracy measurements.

  • Seamless integration with MES and process control systems for real-time feedback and adjustments.

  • Automation features to reduce manual intervention and improve production throughput.

  • Optimizes lithography, etch, and deposition processes, enhancing wafer quality and yield.

For more information, visit the official product page: KLA YieldStar